Accelerated / Burn-In
Accelerated Life Cycle Test / Burn-in Characterization
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required
Intepro's loads feature a recycling technique where >90% of the power drawn from the mains is recycled
Intepro Systems designs and delivers Accelerated Life Test Systems and Burn-In Test Solutions built for manufacturers who need reliable, repeatable results under real-world stress conditions. Whether you are running accelerated life testing for power electronics, EV components, or telecommunications equipment, our automated test systems are engineered to reduce test time, cut energy costs, and surface failures before products reach the field.
Intepro's loads feature a recycling technique where >90% of the power drawn from the mains is recycled. This significantly reduces large energy bills associated with testing using conventional or resistive loads. Our software can readily integrate additional OEM test equipment. It manages data collection and facilitates full load profiling and power cycling functions.
Intepro continually develops product lines in close collaboration with customers delivering a wide range of test solutions to meet various customer requirements regardless of the complexity. For more information click on the following links or contact your nearest Intepro consultant.
Key Features
Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions specifically for
AC/DC and DC/DC converters
- Rechargeable batteries
- Power electronic components
- HALT and HASS Test Screening
Burn-In Test Solutions
Our burn-in test systems are specifically designed to identify and eliminate potential early failures in electronic components and power devices. These systems are essential for manufacturers who want to ensure the reliability and durability of their products before they reach the market.
Our burn-in test systems and Burn-In Test Solutions are built to deliver consistent, repeatable results across every device type:
Custom Test Profiles: Tailored to meet specific customer requirements, including test duration, temperature, voltage, current, and environmental conditions.
High Power and Load Handling: Capable of testing high-power and high-current devices, making them ideal for power supplies, DC-DC converters, and other power electronics.
Automated and Efficient Testing: Our automated test systems reduce manual intervention, increase throughput, and ensure consistent, repeatable results across all burn-in cycles.
Advanced Monitoring and Data Acquisition: Real-time monitoring of key parameters such as voltage, current, power, and temperature to detect failures early.
Accelerated Life Test Systems
Accelerated life testing (ALT) is a critical process that simulates the long-term effects of aging and stress on products to predict their lifespan. Intepro Systems offers comprehensive Accelerated Life Test Systems to help manufacturers identify potential failure modes and improve product reliability. Our accelerated life testing solutions are fully configurable to match your production and validation requirements:
Customizable and Modular: Designed to accommodate a wide range of power levels, environmental conditions, and testing scenarios.
Scalable Solutions: Built as modular automated test systems, easily expandable to meet evolving testing needs or higher production volumes.
Integration with Environmental Chambers: Our systems can be integrated with temperature, humidity, and vibration chambers to simulate real-world operating conditions.
Data-Driven Insights: Our software tools provide detailed data analysis and reporting capabilities to help you understand product performance and make informed decisions.
If you need burn-in test systems for early failure screening or a complete Accelerated Life Cycle Test platform for long-term validation, Intepro Systems provides the testing solution to meet your needs.
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FAQ
Accelerated Life Testing (ALT) systems simulate extended periods of operation in a shorter time frame by applying high-stress environmental conditions, while burn in systems screen for early-life failures in electronics. These systems use programmable electronic loads to stress devices under test (DUT) intentionally.
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