Intepro Systems

Traction Inverters & Motor Drives

Testing traction inverters, motor control units, on-board chargers on bidirectional HV DC with regeneration. What you are proving is that the drive behaves across the whole DC input window, including regen.

Device under test
traction inverters, motor control units, on-board chargers
Bus
bidirectional HV DC with regeneration
Who buys this
powertrain and drive engineering teams

A drive regenerates, so the supply has to sink as readily as it sources. That single requirement eliminates most unidirectional bench supplies before any other spec matters.

Where programmes get caught out

  • The supply must sink as well as source

    A regenerating drive pushes energy back. Unidirectional supplies are eliminated at this requirement, whatever else they offer.

  • Battery emulation beats a real pack on a line

    An emulated source is repeatable, always at the state of charge you asked for, and does not need charging between units.

  • Ripple superposition is usually the gap

    Meeting the voltage window is straightforward. Superimposing the specified ripple across it is where bench supplies fail.

Where the standards have moved

Revision status changes what your report has to cite. Every note below carries the record it came from, retrieved on the date shown.

  • AQG 324 is the automotive module qualification guideline — and it was written for silicon

    The ECPE working group formed in June 2017 and released AQG 324 on 12 April 2018, building on the German LV 324. It defines a common procedure for characterisation, environmental and lifetime testing of power modules used in motor-vehicle converter units. The released version focuses on silicon-based modules; wide-bandgap coverage for SiC and GaN was scheduled for later versions. If your drive inverter uses SiC modules, the guideline your customer names and the guideline that actually covers your device may not be the same document.

    Source: Automotive AQG 324 working groupECPE (European Center for Power Electronics). Retrieved 2026-08-24.

  • The module-level stresses are bias-and-temperature endurance, not switching demos

    A revised AQG 324 annex on SiC-based modules gives specific guidance on power cycling, high-temperature gate bias, high-temperature reverse bias and dynamic reverse bias. Each is a long hold at a fixed electrical condition rather than a short characterisation sweep, which is why the equipment question is duration stability and per-device monitoring rather than peak capability.

    Source: Reliability and Standardization for SiC Power DevicesDonald A. Gajewski and colleagues, Materials Science Forum vol. 1092. Retrieved 2026-08-24.

Testing to a standard

The clause-by-clause limits, and what each standard deliberately says nothing about.

Equipment for this work

Specifying a bench for ev-drive?

Send the clause you have to satisfy rather than a shopping list. An engineer will tell you what the rig has to do — including the parts of the programme this equipment does not cover.

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