ISO 16750-2
ISO 16750-2 Automotive Electrical Loads Testing
Revision 2023 (fifth edition), replaces ISO 16750-2:2012
Programmable DC source covering 0–36 V steady state with millisecond profile sequencing — cranking waveforms with 2 Hz ripple and 1 ms transient edges — plus superimposed AC ripple injection from 10 Hz to 200 kHz at up to 15 A peak-to-peak, slow ramps down to 0.5 V/min, and polarity reversal to −26 V. Micro interruptions need a series switch that opens in ≤ 10 µs to ≥ 10 MΩ, and load dump needs a pulse delivered from a defined 0.5–8 Ω source resistance at up to 202 V peak — a specified source-impedance pulse, not just a voltage setpoint.
This standard turns on
- supply-voltage code system (A–H)
- cranking and starting profiles
- load dump
- superimposed ripple to 200 kHz
- micro interruptions
And says nothing about
- EMC and radiated immunity — 4.13 points out to the EMC standards
- high-voltage traction buses (LV 123 territory)
- 400 Hz aviation power
- reliability-duration testing
- grid ride-through
Cited limits
Every value carries the clause, table or figure it comes from.
| Parameter | Value | Clause |
|---|---|---|
| Supply-voltage codes, 12 V systems | Code A 6–16 V; B 8–16 V; C 9–16 V; D 10.5–16 V; Z as agreed | Table 3 |
| Supply-voltage codes, 24 V systems | Code E 10–32 V; F 16–32 V; G 22–32 V; H 18–32 V; Z as agreed | Table 4 |
| Long-term overvoltage (alternator regulator failure) | 18 V (12 V systems) / 36 V (24 V systems) for 60 min at Tmax − 20 K | §4.3.1.1 |
| Jump start (12 V systems only) | 26 V for 60 ± 6 s, rise/fall ≤ 10 ms, from USmin 10.8 V | Table 5 / Figure 2 |
| Transient overvoltage | 18 V (12 V) / 36 V (24 V) for 400 ms, rise/fall 1 ms (12 V) or 2 ms (24 V), 5 pulses at 1 s rest | Table 6 / Figure 3 |
| Superimposed alternating voltage | 10 Hz–200 kHz sweep, 2 % logarithmic steps; severity 1 Upp 6 V (12 V) / 10 V (24 V); severity 4 Upp 1 V at 30–200 kHz; ripple current limit 15 A (f1) / 10 A (f2) | Table 7 / Table 8 |
| Slow decrease and increase of supply voltage | UA → 0 V → UA at (0.5 ± 0.1) V/min, linear or steps ≤ 25 mV | §4.5.2 / Figure 6 |
| Micro interruption in supply voltage | tmicro 10 µs–2 s stepped from 10 µs; switch reaction ≤ 10 µs; open-switch resistance ≥ 10 MΩ | Table 9 / §4.6.1.2 |
| Reset behaviour at voltage drop | staircase in 5 % steps of USmin down to 0 V, ≥ 5 s per drop, functional check at each return to USmin | §4.6.2.2 / Figure 12 |
| Starting profile (24 V, severest level) | drop to US1 6 V for 50 ms, then cranking plateau US 10 V with 2 Hz ripple; profile applied 10 times, ≥ 2 s recovery | Table 12 / Figure 13 |
| Load dump, Test A (no centralized suppression) | US 79–101 V (12 V) / 151–202 V (24 V); Ri 0.5–4 Ω / 1–8 Ω; td 40–400 ms / 100–350 ms; 10 pulses at 1 min intervals | Table 13 / Figure 14 |
| Load dump, Test B (centralized suppression) | clamped US* 27/30/32/35 V at severity 1–4 (12 V); 24 V as specified, typical 58 V; 5 pulses at 1 min intervals | Table 14 / Figure 15 |
| Reversed voltage | −14 V (12 V) / −26 V (24 V) for 60 s (test case 2); −4 V for 60 s (test case 1, 12 V only) | Table 15 / Table 16 |
Where these figures came from
Each record below backs a specific part of this page. Where a table sits behind a paywall we say so above rather than reproducing it.
- ISO 16750-2:2023 — Road vehicles — Environmental conditions and testing for electrical and electronic equipment — Part 2: Electrical loads — ISO. Retrieved 2026-08-24. Supports: id, title, edition (fifth, 2023), scope
- ISO 16750-2:2023 official preview sample (front matter and Clauses 4.1–4.4) — iTeh Standards (ISO preview distributor). Retrieved 2026-08-24. Supports: Tables 3–8 (supply-voltage codes, jump start, transient overvoltage, superimposed AC), fifth-edition change list, revision note
- ISO 16750-2:2023 full-text republication — LISUN Group (test-equipment vendor). Retrieved 2026-08-24. Supports: Clauses 4.5–4.7: slow ramp rate, micro interruption Tables 9–10, reset behaviour Figure 12, starting profile Tables 11–12, load dump Tables 13–14, reversed voltage Tables 15–16
- Quick Guide on Automotive Load Dump Protection (ISO 16750-2) — MCC Semiconductors (application note). Retrieved 2026-08-24. Supports: independent cross-check of load dump Test A/Test B pulse counts, amplitudes (101 V / 202 V) and Test B severity clamp values
Further reading
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